近期活动 工業量測解決方案

ZEISS Innovation Day: Surface Finish Metrology

日期

2018-10-10

地点

USA / Dayton, OH

This informative session will cover how to deal with the R parameters pertaining to surface roughness, including averaging, Peak to Valley, Slope, Spacing, Counting and Bearing Area Curve.  Industry expert, Mark C. Malburg, Ph.D. will lead this session.