测量无死角
ZEISS DotScan
ZEISS DotScan
特点ZEISS DotScan 是测量自由曲面和细微结构的不二选择。ZEISS DotScan 采用色阶共聚焦白光探头,特别适用于测量敏感、柔软、具反射性或低对比度的表面,因为对于这类表面,探针或相机传感器已超过其能力所及。
![使用蔡司DotScan采集自由曲面 蔡司DotScan的应用范围包括敏感、反射或低对比度的表面。]({"small":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section/sectionpar/column_control_740530448/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.s.1565695346560.jpg/zeiss-rds-carrier-with-dotscan-sensor.jpg","large":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section/sectionpar/column_control_740530448/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.l.1565695346560.jpg/zeiss-rds-carrier-with-dotscan-sensor.jpg","medium":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section/sectionpar/column_control_740530448/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.m.1565695346560.jpg/zeiss-rds-carrier-with-dotscan-sensor.jpg","full":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section/sectionpar/column_control_740530448/column0/columnpar/visibilitycontainer/wrapperpar/image/image.pic.f.1565695346560.jpg/zeiss-rds-carrier-with-dotscan-sensor.jpg"})
使用 ZEISS DotScan 时,具高反射性的表面如膝关节植入物的金属部件无须注入造影剂,即可进行扫描。因此,使用此探头也能区分透明上漆表层和其下方的金属层。
![ZEISS DotScan: available in three sizes ZEISS DotScan is available in three sizes for different measuring ranges]({"small":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section_879787421/sectionpar/column_control_2068187972/column/columnpar/visibilitycontainer/wrapperpar/parallax/layerpar/foreground/foreground/image/image.pic.s.1546504026265.png/zeiss-dotscan-product-image-closup.png","large":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section_879787421/sectionpar/column_control_2068187972/column/columnpar/visibilitycontainer/wrapperpar/parallax/layerpar/foreground/foreground/image/image.pic.l.1546504026265.png/zeiss-dotscan-product-image-closup.png","medium":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section_879787421/sectionpar/column_control_2068187972/column/columnpar/visibilitycontainer/wrapperpar/parallax/layerpar/foreground/foreground/image/image.pic.m.1546504026265.png/zeiss-dotscan-product-image-closup.png","full":"/gongyeceliang/chanpin/tantou/on-cmm/optical-sensors-cmm/dotscan/j/m/section_879787421/sectionpar/column_control_2068187972/column/columnpar/visibilitycontainer/wrapperpar/parallax/layerpar/foreground/foreground/image/image.pic.f.1546504026265.png/zeiss-dotscan-product-image-closup.png"})
用途多样灵活
ZEISS DotScan 共有三种探头尺寸,适用于三种不同的测量范围:10、3 和 1 mm。探头可在一次 CNC 运行期间全自动更换,以适用于不同的表面,或改换其他光学探头。
关节轴每次可移动 2.5 度,可将 ZEISS DotScan 调整到垂直于待测量部件。且由于 ZEISS DotScan 1 mm 的测量角度是 +/- 30 度,因此更大曲率的部件也能测量。再加上探针的操作模式,使得各种材料都能毫无问题地从各种角度进行测量。配合使用转台,甚至连 4 轴的测量工作也难不倒 ZEISS DotScan。