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![三坐标测量机上的接触式和光学测头]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.100.33.0,70,1920,710.file/header_option1.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.360.120.0,70,1920,710.file/header_option1.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.768.256.0,70,1920,710.file/header_option1.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.1024.341.0,70,1920,710.file/header_option1.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.1280.427.0,70,1920,710.file/header_option1.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.1440.480.0,70,1920,710.file/header_option1.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/header_option1.jpg/_jcr_content/renditions/original.image_file.1920.640.0,70,1920,710.file/header_option1.jpg"} "三坐标测量机上的接触式和光学测头")
![接触式扫描测头]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.100.75.107,0,1814,1280.file/tactile.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.360.270.107,0,1814,1280.file/tactile.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.768.576.107,0,1814,1280.file/tactile.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.1024.768.107,0,1814,1280.file/tactile.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.1280.960.107,0,1814,1280.file/tactile.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.1440.1080.107,0,1814,1280.file/tactile.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile.jpg/_jcr_content/renditions/original.image_file.1707.1280.107,0,1814,1280.file/tactile.jpg"} "接触式扫描测头")
![光学扫描测头]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.100.75.107,0,1814,1280.file/optical.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.360.270.107,0,1814,1280.file/optical.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.768.576.107,0,1814,1280.file/optical.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.1024.768.107,0,1814,1280.file/optical.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.1280.960.107,0,1814,1280.file/optical.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.1440.1080.107,0,1814,1280.file/optical.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/optical.jpg/_jcr_content/renditions/original.image_file.1707.1280.107,0,1814,1280.file/optical.jpg"} "光学扫描测头")
![粗糙度测量]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.100.75.107,0,1814,1280.file/rotos_roughness.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.360.270.107,0,1814,1280.file/rotos_roughness.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.768.576.107,0,1814,1280.file/rotos_roughness.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.1024.768.107,0,1814,1280.file/rotos_roughness.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.1280.960.107,0,1814,1280.file/rotos_roughness.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.1440.1080.107,0,1814,1280.file/rotos_roughness.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/rotos/rotos_roughness.jpg/_jcr_content/renditions/original.image_file.1707.1280.107,0,1814,1280.file/rotos_roughness.jpg"} "粗糙度测量")
![测头座]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.100.75.107,0,1814,1280.file/probe_holders_rds.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.360.270.107,0,1814,1280.file/probe_holders_rds.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.768.576.107,0,1814,1280.file/probe_holders_rds.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.1024.768.107,0,1814,1280.file/probe_holders_rds.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.1280.960.107,0,1814,1280.file/probe_holders_rds.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.1440.1080.107,0,1814,1280.file/probe_holders_rds.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe_holders_rds.jpg/_jcr_content/renditions/original.image_file.1707.1280.107,0,1814,1280.file/probe_holders_rds.jpg"} "测头座")