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场发射扫描电镜
ZEISS Sigma
获取可靠的高分辨率成像和分析结果
ZEISS Sigma基于成熟的蔡司Gemini技术。Gemini物镜的设计将静电场和磁场相结合，最大限度提高了光学性能，同时将样品处的磁场影响降至最低。因此，即使是在磁性材料等具有挑战性的样品上，也能获得出色的成像效果。
用于工业领域的ZEISS Sigma
测试样品时体验全新的质量水平
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Gemini镜内检测概念通过检测二次电子（SE）和/或背向散射电子（BSE）来确保高效的信号检测，从而最大限度地缩短成像时间。Gemini光束增强器技术保证了探测器的小尺寸和高信噪比。
您可以利用全新的检测技术对所有样品进行表征。利用新型ETSE探测器和高真空模式下的InLens探测器，来收集高分辨率地形信息。使用VPSE或C2D探测器在变压模式下获取清晰图像。利用STEM探测器生成高分辨率传输图像，并用HDBSD或YAG探测器调查成分。
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应用领域一览
- 材料和制成部件的失效分析
- 钢和金属的成像与分析
- 医疗器械的检测
- 过程控制和诊断中的半导体和电子设备表征
- 新型纳米材料的高分辨率成像和分析
- 涂层和薄膜分析
- 各种形式的碳和其他二维材料的表征
- 聚合物材料的成像、分析和区分
- 开展电池研究，了解老化效应和质量改进
自动颗粒分析和多模态关联成像
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ZEISS SmartPI
ZEISS SmartPI专为在生产环境中对常规样品进行可重复的大批量分析而设计。识别、分析和报告污染数据的能力为过程控制增添了新维度。您将受益于扫描电镜颗粒全自动分析和分类的重大改进。让ZEISS SmartPI提高您的生产率和质量并降低您的污染成本。根据形态和元素组成自动检测、测量、计数和分类相关颗粒。
自动生成行业标准报告，如VDA 19.1和ISO 16232
与Bruker & Oxford的能谱仪系统完全内置和兼容
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