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![蔡司RDS]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.100.56.0,219,1000,782.file/rds_slideshow_2.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.360.203.0,219,1000,782.file/rds_slideshow_2.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.768.432.0,219,1000,782.file/rds_slideshow_2.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.1000.563.0,219,1000,782.file/rds_slideshow_2.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.1000.563.0,219,1000,782.file/rds_slideshow_2.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.1000.563.0,219,1000,782.file/rds_slideshow_2.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_2.jpg/_jcr_content/renditions/original.image_file.1000.563.0,219,1000,782.file/rds_slideshow_2.jpg"} "蔡司RDS")
![蔡司RDS]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.100.56.3,147,992,703.file/rds_slideshow_3.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.360.203.3,147,992,703.file/rds_slideshow_3.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.768.432.3,147,992,703.file/rds_slideshow_3.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.989.556.3,147,992,703.file/rds_slideshow_3.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.989.556.3,147,992,703.file/rds_slideshow_3.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.989.556.3,147,992,703.file/rds_slideshow_3.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds_slideshow_3.jpg/_jcr_content/renditions/original.image_file.989.556.3,147,992,703.file/rds_slideshow_3.jpg"} "蔡司RDS")
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蔡司关节式测针（ZAS）
ZAS是一种由电机驱动、软件控制的关节式测针，可在一个平面内旋转，取代了固定测针的多种配置。这样便可在不更换测针的情况下实现不同的角度位置。
蔡司关节式测针与高性能的蔡司VAST gold测头兼容，凭借关节式测针的稳定性，可实现极高的精度。只需几秒钟便能设置好相应的角度位置，节省了时间和额外测针系统的存储空间。角度位置可在-135°和+135°之间连续调节。
![测头架和测头座]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.100.33.9,36,1718,606.file/header_desktop.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.360.120.9,36,1718,606.file/header_desktop.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.768.256.9,36,1718,606.file/header_desktop.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.1024.341.9,36,1718,606.file/header_desktop.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.1280.427.9,36,1718,606.file/header_desktop.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.1440.480.9,36,1718,606.file/header_desktop.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/header_desktop.jpg/_jcr_content/renditions/original.image_file.1709.570.9,36,1718,606.file/header_desktop.jpg"} "测头架和测头座")
测头架和测头座
灵活应对各种测量任务
适用于多种应用的测头架和测头座
利用蔡司测头架可在三坐标测量机上使用光学和接触式测头。借助可旋转的测头架，即便是复杂的工件也能轻松测量。
![蔡司RDS]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original.image_file.100.100.file/rds.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original.image_file.360.360.file/rds.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original.image_file.768.768.file/rds.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original./rds.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original./rds.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original./rds.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/rds.jpg/_jcr_content/renditions/original./rds.jpg"} "蔡司RDS")
蔡司RDS
广泛的角度位置提供了高灵活性
![蔡司DSC]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original.image_file.100.100.file/dsc.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original.image_file.360.360.file/dsc.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original.image_file.768.768.file/dsc.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original./dsc.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original./dsc.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original./dsc.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc.jpg/_jcr_content/renditions/original./dsc.jpg"} "蔡司DSC")
蔡司DSC
高动态、高扭矩和准确结果
![蔡司ZAS]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original.image_file.100.100.file/zas.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original.image_file.360.360.file/zas.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original.image_file.768.768.file/zas.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original./zas.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original./zas.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original./zas.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/zas.jpg/_jcr_content/renditions/original./zas.jpg"} "蔡司ZAS")
蔡司ZAS
用于蔡司VAST gold的关节式测针选件
蔡司DSC
高动态连续关节式系统DSC将蔡司CALENO的性能提升到了全新的水平。该测头架具有出色的角速度、最大的加速度且内置碰撞保护装置，因此安全性极高。
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original.image_file.100.100.file/dsc_module.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original.image_file.360.360.file/dsc_module.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original.image_file.768.768.file/dsc_module.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original./dsc_module.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original./dsc_module.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original./dsc_module.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/cmm/probes-and-sensors/probe-carriers/dsc_module.jpg/_jcr_content/renditions/original./dsc_module.jpg"})
用于蔡司CALENO的蔡司DSC
高动态关节式系统，适用于各种测量任务
蔡司DSC具有高动态、高扭矩和出色的精度，可用于各种测量任务。测头架标配测头弹簧碰撞保护装置，测头架本身还可选配额外的碰撞保护装置。
技术特点：
- 旋转轴A可旋转n × 360
- 最大角速度180°/s
- 最大扭矩3.0 Nm
- 适用于最长800 mm的测针加长杆
- 通过被动测针系统更换架自动更换光学和接触式测头