![ZEISS Visioner 1]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.100.100.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.360.360.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.768.768.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.1024.1024.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.1080.1080.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.1080.1080.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/02_visioner1_links_web_16_9.jpg/_jcr_content/renditions/original.image_file.1080.1080.3,0,1083,1080.file/02_visioner1_links_web_16_9.jpg"} "ZEISS Visioner 1")
ZEISS Visioner 1
数码显微镜采用MALS™技术，可进行实时全聚焦光学检测
传统的检测系统景深较浅，这意味着样品的部分区域可能无法对焦，从而导致特征缺失、用户疲劳和检测不完整。
ZEISS Visioner 1彻底改变了光学检测和记录的世界。在特色微镜阵列透镜系统（MALSTM技术）的驱动下，首次实现了实时全聚焦成像。
实时扩展景深（EDoF）
EDoF是将通过焦平面的多幅图像合成一幅对焦图像的过程。
使用传统的显微镜系统，这一过程可能既耗时又复杂。借助ZEISS Visioner 1，用户可以实时看到完全对焦的样品，而无需对一系列图像进行Z轴序列成像和后期处理。
特色微镜阵列透镜系统（MALS™）技术可实现实时扩展景深（EDoF）。
重塑光学规则
微镜阵列透镜系统（MALS™）技术
MALS™可以对高达69 mm的高度差进行光学检测。无需进行Z轴序列成像或重新对焦。
利用微镜阵列透镜系统（MALS™），我们可以生成具有明显不同曲率的“虚拟”透镜，从而产生不同的聚焦平面。这是通过以协调的方式改变每个微镜的方向来实现的。
通过对这种“虚拟”透镜的曲率进行快速重塑，可实现超快对焦和实时全聚焦成像与记录。
![由MALS™技术驱动的ZEISS Visioner 1]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.100.56.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.360.203.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.768.432.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.1024.576.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.1280.720.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.1440.810.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-malstechnology-image.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,5,1920,1085.file/zeiss-visioner1-malstechnology-image.jpg"} "由MALS™技术驱动的ZEISS Visioner 1")
由MALS™技术驱动的ZEISS Visioner 1
- 可用扩展景深最多可提高100倍
- 允许最大69 mm的高度差
- 在平面上排列的具有（可变）曲率的反射式微镜阵列
- 每个微镜的尺寸约为100×100 µm
- 每个微镜均可旋转及平移，形成曲率可变的光学表面
- 无需进行Z轴序列成像或重新对焦
![快速三维可视化和记录]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.100.67.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.360.240.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.768.512.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.1024.683.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.1280.853.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.1440.960.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/zeiss-visioner1-fastest-visualization.png/_jcr_content/renditions/original.image_file.1920.1280.106,0,2770,1776.file/zeiss-visioner1-fastest-visualization.png"} "快速三维可视化和记录")
快速三维可视化和记录
ZEISS Visioner 1不仅简化了成像和记录任务，实时EDoF还使您能够更快地检测部件，提供更高的通量。
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.100.67.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.360.240.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.768.512.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1024.683.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1280.853.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1440.960.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1620.1080.150,0,1770,1080.file/ergonomic-opertion-classic-microscope.jpg"})
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.100.67.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.360.240.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.768.512.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1024.683.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1280.853.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1440.960.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1920.1280.184,0,2164,1320.file/ergonomic-opertion-zeiss-visioner1.jpg"})
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.100.56.file/ergonomic-opertion-classic-microscope.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.360.203.file/ergonomic-opertion-classic-microscope.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.768.432.file/ergonomic-opertion-classic-microscope.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1024.576.file/ergonomic-opertion-classic-microscope.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1280.720.file/ergonomic-opertion-classic-microscope.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original.image_file.1440.810.file/ergonomic-opertion-classic-microscope.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-classic-microscope.jpg/_jcr_content/renditions/original./ergonomic-opertion-classic-microscope.jpg"})
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.100.56.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.360.203.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.768.432.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1024.576.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1280.720.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1440.810.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/ergonomic-opertion-zeiss-visioner1.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,0,2347,1320.file/ergonomic-opertion-zeiss-visioner1.jpg"})
应用
使用传统检测方法与使用ZEISS Visioner 1对一块电板和一根针进行成像对比。由于采用了全新的MALS™技术，因此每次都能在第一时间全聚焦显示部件。
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.100.75.file/elec-traditional-microscope-scale.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.360.270.file/elec-traditional-microscope-scale.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.768.576.file/elec-traditional-microscope-scale.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.1024.768.file/elec-traditional-microscope-scale.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.1280.960.file/elec-traditional-microscope-scale.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.1440.1080.file/elec-traditional-microscope-scale.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-traditional-microscope-scale.jpg/_jcr_content/renditions/original.image_file.1920.1440.file/elec-traditional-microscope-scale.jpg"})
电板
用传统显微镜检测
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.100.75.file/elec-zeiss-visioner1-scale.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.360.270.file/elec-zeiss-visioner1-scale.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.768.576.file/elec-zeiss-visioner1-scale.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.1024.768.file/elec-zeiss-visioner1-scale.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.1280.960.file/elec-zeiss-visioner1-scale.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.1440.1080.file/elec-zeiss-visioner1-scale.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/elec-zeiss-visioner1-scale.jpg/_jcr_content/renditions/original.image_file.1920.1440.file/elec-zeiss-visioner1-scale.jpg"})
电板
用ZEISS Visioner 1检测
![]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.100.75.file/bulb-traditional-microscope-scale2.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.360.270.file/bulb-traditional-microscope-scale2.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.768.576.file/bulb-traditional-microscope-scale2.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.1024.768.file/bulb-traditional-microscope-scale2.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.1280.960.file/bulb-traditional-microscope-scale2.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.1440.1080.file/bulb-traditional-microscope-scale2.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/systems/industrial-microscopy/lm--dm--xray-portfolio/vision-1/bulb-traditional-microscope-scale2.jpg/_jcr_content/renditions/original.image_file.1920.1440.file/bulb-traditional-microscope-scale2.jpg"})
针
用传统显微镜检测
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