![蔡司PiWeb强大的统计分析功能]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.33.file/piweb-powerful-statistics.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.120.file/piweb-powerful-statistics.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.256.file/piweb-powerful-statistics.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.341.file/piweb-powerful-statistics.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.427.file/piweb-powerful-statistics.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.480.file/piweb-powerful-statistics.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original./piweb-powerful-statistics.jpg"} "蔡司PiWeb强大的统计分析功能")
利用蔡司PiWeb实现强大的统计分析
轻松创建全面的统计数据
无论您是需要提供有关测量结果质量还是生产过程的信息：蔡司PiWeb均可为您提供任何有助于追踪生产质量的统计数据。
![重复性和复现性研究]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_powerful-statistics.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_powerful-statistics.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_powerful-statistics.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_powerful-statistics.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_powerful-statistics.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_powerful-statistics.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original./piweb_powerful-statistics.jpg"} "重复性和复现性研究")
重复性和复现性研究
使用接触式、光学或手动测量数据执行类型为I、II和III ARM和方差分析的重复性和复现性研究。
![控制图]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_control-chart.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_control-chart.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_control-chart.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_control-chart.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_control-chart.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_control-chart.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original./piweb_control-chart.jpg"} "控制图")
控制图
利用内置的x̅、S（标准偏差）和R（范围）图评估过程数据。
![能力研究]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.100.56.27,21,1863,1055.file/piweb_capability-studies.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.360.203.27,21,1863,1055.file/piweb_capability-studies.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.768.432.27,21,1863,1055.file/piweb_capability-studies.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1024.576.27,21,1863,1055.file/piweb_capability-studies.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1280.720.27,21,1863,1055.file/piweb_capability-studies.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1440.810.27,21,1863,1055.file/piweb_capability-studies.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1836.1033.27,21,1863,1055.file/piweb_capability-studies.jpg"} "能力研究")
![能力研究]({"xsmall":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_capability-studies.jpg","small":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_capability-studies.jpg","medium":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_capability-studies.jpg","large":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_capability-studies.jpg","xlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_capability-studies.jpg","xxlarge":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_capability-studies.jpg","max":"https://www.zeiss.com.cn/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original./piweb_capability-studies.jpg"} "能力研究")
能力研究
进行各种能力研究，包括Cm、Cmk、Cp、Cpk、Po、Pok等。
更多工具
创建包含其他有用工具的报告，如方框图、柱状图、趋势线和条形图。