VersaXRM-520

The VersaXRM-520 frees researchers to push the boundaries of lab-based imaging. With prominent facilities worldwide using non-destructive X-ray microscopy (XRM) to extend the use of valuable samples, the VersaXRM family proves a powerful component of a correlative microscopy solution.

The VersaXRM-520 adds a host of innovations to Xradia's industry-leading resolution, contrast and powerful advantages for conducting in situ studies under native or controlled conditions. The instrument delivers compositional contrast for better discernment between materials appearing nearly identical, faster time-to-results for time-sensitive applications, and superior ease-of-use for multi-user environments.

Xradia VersaXRM solutions are ideal for highly skilled users as well as busy imaging labs with diverse user needs and skillsets. Breakthrough applications for the VersaXRM-520 include compositional contrast in materials science, high aspect ratio tomography for semiconductor failure analysis and 4D studies of material evolution over time. Highlights include advanced contrast tuning capabilities, extensive filtering options, and faster time to results with higher throughput.

The VersaXRM advances lab-based X-ray imaging with breakthrough techniques and innovations:

Dual Scan Contrast Visualizer (DSCoVer)
DSCoVer provides flexible side-by-side tuning of two distinct tomographies to enable compositional probing for features normally indistinguishable in a single scan, allowing researchers to seamlessly and easily collect the data required for dual energy analysis. Imaging a sample at two different X-ray spectra—or in two different states—with the resulting datasets aligned and then combined assures optimum contrast for the material of interest and repeatable research parameters.

By enabling exploration of contrast based on differences between the effective atomic number and density of features within a sample, DSCoVer can provide mineralogical distinction in rocks and distinguish between other difficult-to-discern materials.

High-Aspect Ratio Tomography (HART)
A higher throughput imaging mode, HART speeds tomography acquisition by up to 50% for "flat" samples such as semiconductor packages. Variable projection spacing requires fewer projections to be collected along the front of the flat sample, and more to be collected along the thin side of the sample, for faster time-to-results or significantly better image quality within the traditional time.

Automated Filter Changer (AFC)
Source filters, which are used to tune the X-ray energy spectrum, are an important complement to DSCoVer and in situ applications. The AFC houses a standard range of 12 filters along with space for a dozen additional custom filters for new applications. Filter selection is easily programmed and recorded within imaging recipes so filters may be changed without disrupting the work flow.

The Optional In situ Interface Kit
X-ray imaging is uniquely suited to image materials under variable environments with controlled conditions including over time (4D) to non-destructively characterize and quantify the evolution of 3D microstructures. With its unique architecture, the VersaXRM has emerged as the industry's premier solution supporting the use of the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages. The optional In Situ Interface Kit delivers stable and robust support of often-large and complex in situ facilities and ensures XRM performance is maintained, along with recipe-based software capability that simplifies operation from within the VersaXRM user interface.

VersaXRM architecture delivers:

• True spatial resolution down to 700 nm
• Resolution at a Distance (RaaD) delivering large, flexible working distances while maintaining submicron resolution
• Industry-leading in situ solution with a wide variety of in situ rigs supported for submicron imaging of samples (up to inches in size) in natural environments. Where the resolution of conventional micro-CT approaches degrades when samples are placed within spacious in situ chambers, RaaD enables the Versa-XRM to maintain high resolution as the space between the X-ray source and sample grows
• Faster time to results (days or weeks vs. months or years) for core analysis in studies of energy and geo materials
• Enhanced Absorption Contrast Detectors optimized to maximize collection of contrast-forming low energy X-ray photons
• Tunable Propagation Phase Contrast enables visualization of low Z materials and biological samples that tend to have poor absorption contrast
• Wide Field Mode (WFM) nearly 2X as wide as the standard mode for larger field of view at resolution. Resulting 3D volumes are more than 3X larger
  

Materials Science
Xradia provides compositional probing using combined scans at two different energies to easily identify nearly identical materials and hard-to-see features. Producing results previously unachievable with a single scan, the VersaXRM-520 seamlessly delivers the data required for dual-energy analysis. Automated filter changing supports custom or specialized imaging for better, easier understanding of materials.

Electronics / Semiconductor
The VersaXRM-520 introduces critical productivity advantages for non-destructively imaging intact semiconductor packages and wafers in 3D. With High-Aspect Ratio Tomography (HART) delivering increased throughput for flat samples, the system efficiently delivers high resolution virtual cross sections that aid in exploring defects or optimizing processes.

Natural Resources
The VersaXRM-520 gives users expanded field-of-view capabilities for high resolution imaging of larger volumes to increase the size and variety of rocks that can be imaged. Advanced contrast mechanisms enable mineralogical distinction with more greyscale differences and also enable finer discernment of unstained rock samples, such as a clear view between brine, water and rock in fluid flow experiments for measuring pore networks.

Life Sciences
Xradia delivers unparalleled imaging quality for soft materials such as stained or unstained tissue and hard materials such as bone or dentin. Advantages include high resolution, high absorption contrast, and unique phase contrast technology for developmental biology, biomechanics, neuroscience, 3D cellular composition. Non-destructive X-ray technology facilitates correlative microscopy, augmenting fluorescence results and gaining powerful insight before the sample must be sacrificed in the EM lab.

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