![用于材料研究的蔡司Axio Imager 2]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg"} "用于材料研究的蔡司Axio Imager 2")
产品
用于材料研究的蔡司Axio Imager 2
用于自动材料分析的开放式显微镜系统
在您从事先进的材料研究时，Axio Imager 2可帮助简化光学显微镜工作流。蔡司Axio Imager 2能够对材料生成准确且可重复的结果。选择适合您应用的系统，使用颗粒分析等专用共聚焦或关联显微镜解决方案扩展您的设备。
![可重复的结果——享受无振动的工作环境]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.100.50.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.360.180.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.768.384.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1024.512.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1280.640.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1440.720.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1904.952.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg"} "可重复的结果——享受无振动的工作环境")
可重复的结果
享受无振动的工作环境
如要获得准确的结果，稳定性必不可少。Axio Imager 2具有稳定的成像条件，而在使用高放大倍率或进行对时间有高要求的研究时，该特性更为显著。Axio Imager 2的电动化设计可以获得快速且可重复的结果，同时始终在恒定条件下工作。
![模块化设计——获得更大的灵活性]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.100.50.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.360.180.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.768.384.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1024.512.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1280.640.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1440.720.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original./benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg"} "模块化设计——获得更大的灵活性")
模块化设计
获得更大的灵活性
无论是学术还是工业研究，材料显微镜都面临着各种各样的挑战。借助Axio Imager 2，您将能够直面并战胜这些挑战。您可以连接特定于应用的组件，进行颗粒分析等工作，也可以检测非金属夹杂物（NMI）、液晶或基于半导体的MEM。借助专用共聚焦或关联显微镜解决方案，您的设备功能将得到扩展。
![高光学性能——实现出色衬度和分辨率]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.100.50.file/axio-imager_nosepiece-turret_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.360.180.file/axio-imager_nosepiece-turret_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.768.384.file/axio-imager_nosepiece-turret_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/axio-imager_nosepiece-turret_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/axio-imager_nosepiece-turret_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/axio-imager_nosepiece-turret_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original./axio-imager_nosepiece-turret_1.jpg"} "高光学性能——实现出色衬度和分辨率")
高光学性能
实现出色衬度和分辨率
- 使用不同观察方式观测金属、复合材料或液晶等一系列材料。
- 使用反射光，在明场、暗场、微分干涉相差（DIC）、圆微分干涉相差（C-DIC）、偏光或荧光下观察样品。
- 使用透射光，在明场、暗场、微分干涉相差（DIC）、偏光或圆偏光下检测样品。观察方式管理器能确保照明设置可复制。
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。明场]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.67.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.240.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/brightfield_cast-iron_axio-imager-2.jpg"} "明场")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。暗场]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.67.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.240.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/darkfield_cast-iron_axio-imager-2.jpg"} "暗场")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。偏光（正交偏光）]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.67.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.240.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2.jpg"} "偏光（正交偏光）")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。使用附加了Lambda补偿器的偏光]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.100.67.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.360.240.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/pol_cast-iron_axio-imager-2_1.jpg"} "使用附加了Lambda补偿器的偏光")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。圆微分干涉相差（C-DIC）]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.67.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.240.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.709.473.0,29,709,502.file/c-dic_cast-iron_axio-imager-2.jpg"} "圆微分干涉相差（C-DIC）")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。明场]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/brightfield_cast-iron_axio-imager-2.jpg"} "明场")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。明场]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.file/brightfield_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.file/brightfield_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./brightfield_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./brightfield_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./brightfield_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./brightfield_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/brightfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./brightfield_cast-iron_axio-imager-2.jpg"} "明场")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。暗场]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.0,0,708,531.file/darkfield_cast-iron_axio-imager-2.jpg"} "暗场")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。暗场]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.file/darkfield_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.file/darkfield_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./darkfield_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./darkfield_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./darkfield_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./darkfield_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/darkfield_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./darkfield_cast-iron_axio-imager-2.jpg"} "暗场")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。偏光（正交偏光）]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2.jpg"} "偏光（正交偏光）")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。使用附加了Lambda补偿器的偏光]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.100.75.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.360.270.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/pol_cast-iron_axio-imager-2_1.jpg"} "使用附加了Lambda补偿器的偏光")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。使用附加了Lambda补偿器的偏光]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.100.75.file/pol_cast-iron_axio-imager-2_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original.image_file.360.270.file/pol_cast-iron_axio-imager-2_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original./pol_cast-iron_axio-imager-2_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original./pol_cast-iron_axio-imager-2_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original./pol_cast-iron_axio-imager-2_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original./pol_cast-iron_axio-imager-2_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/pol_cast-iron_axio-imager-2_1.jpg/_jcr_content/renditions/original./pol_cast-iron_axio-imager-2_1.jpg"} "使用附加了Lambda补偿器的偏光")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。圆微分干涉相差（C-DIC）]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.708.531.1,0,709,531.file/c-dic_cast-iron_axio-imager-2.jpg"} "圆微分干涉相差（C-DIC）")
![球墨铸铁，抛光样品，使用不同观察方式在相同位置成像（观察视野265 µm）。圆微分干涉相差（C-DIC）]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.75.file/c-dic_cast-iron_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.270.file/c-dic_cast-iron_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./c-dic_cast-iron_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./c-dic_cast-iron_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./c-dic_cast-iron_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./c-dic_cast-iron_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/c-dic_cast-iron_axio-imager-2.jpg/_jcr_content/renditions/original./c-dic_cast-iron_axio-imager-2.jpg"} "圆微分干涉相差（C-DIC）")
![人体工程学：表面应用无极限]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.56.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.203.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.768.432.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1024.576.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1280.720.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1440.810.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg"} "人体工程学：表面应用无极限")
人体工程学设计
表面应用无极限
Axio Imager.Z2m或Axio Imager.M2m可在触摸屏上显示关键操作功能，手指轻松点击便可控制所有电动组件。其他控制按钮依照人体工程学设计排列在对焦驱动装置周边，带有触觉反馈的表面使其易于区分。Axio Imager.D2m有5个预编程按钮，Axio Imager.Z2m则有10个用户自定义按钮。Axio Imager.A2m已编码。
![热显微技术：灵活记录温度变化]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,457,343.file/linkam_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,457,343.file/linkam_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg"} "热显微技术：灵活记录温度变化")
热显微技术
灵活记录温度变化
您是否想研究温度对金属、晶体、陶瓷或塑料的影响？
借助ZEN core和Linkam加热台，您可以定制加热或冷却实验。在时间序列中温度模式会得到记录，实验结果将包含每幅时间序列图像中的温度和真空数据。您可以在质量控制等应用领域中观察样品在加热和冷却过程中的变化。
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.100.67.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.360.240.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.768.512.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1024.683.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1280.853.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1440.960.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_liquidcrystalline_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1920.1280.0,80,1920,1360.file/polarization_liquidcrystalline_axioimager2_1.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.100.67.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.360.240.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.768.512.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1024.683.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1280.853.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1440.960.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/polarization_anodizedalni_axioimager2_1.jpg/_jcr_content/renditions/original.image_file.1920.1280.0,80,1920,1360.file/polarization_anodizedalni_axioimager2_1.jpg"})
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ZEISS Axio Imager 2
Your Open Microscope System for Automated Material Analysis
文件大小: 9 MB -
Microscope and Measurement Systems for Quality Assurance and Quality Control
Capture the essentials of your component. Quickly. Simply. Comprehensively.
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ZEISS Microscopy Solutions for Steel and Other Metals
Multi-modal characterization and advanced analysis options for industry and research
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Analysis and Quantification of Non-metallic Inclusions in Steel
Shuttle & Find
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Applications of Microscopy in Additive Manufacturing
Utilizing ZEISS Light and Electron Microscope Systems
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Light Microscopic Analysis of the Intrinsic Properties of Magnetically Hard Phases from the Domain Structure
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Optical Analysis of Shape and Roughness of a Gear Wheel
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Topography and Refractive Index Measurement
of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy
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ZEISS Microscopy Solutions for Oil & Gas
Understanding reservoir behavior with pore scale analysis
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