近期活动

IPFA 2020 Int'l Symposium on the Physical & Failure Analysis of Integrated Circuits

日期

2020-07-20 - 2020-07-23

地点

China / Hangzhou

IPFA will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear-out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device / circuit / module failure that serves as critical input for future design for reliability.